Browsing Conference contributions by author "Waeytens, Ruben"

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Analysis of the Influence of Roughness on the Propagation Constant of a Waveguide via Two Sparse Stochastic Methods

Waeytens, Ruben; Bosman, Dries; Huynen, Martijn; Gossye, Michiel; Rogier, Hendrik; Vande Ginste, Dries (2020)
Reduced-Order Stochastic Testing of Interconnects Subject to Line Edge Roughness

Huynen, Martijn; Waeytens, Ruben; Bosman, Dries; Gossye, Michiel; Rogier, Hendrik; Vande Ginste, Dries (2023)