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Reduced-Order Stochastic Testing of Interconnects Subject to Line Edge Roughness
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Authors
Huynen, Martijn
;
Waeytens, Ruben
;
Bosman, Dries
;
Gossye, Michiel
;
Rogier, Hendrik
;
Vande Ginste, Dries
DOI
10.1109/SPI57109.2023.10145572
EISBN
979-8-3503-3282-7
ISSN
2475-9481
Conference
27th IEEE Workshop on Signal and Power Integrity (SPI)
Journal
N/A
Title
Reduced-Order Stochastic Testing of Interconnects Subject to Line Edge Roughness
Publication type
Proceedings paper
Embargo date
2023-05-10
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2
20.500.12860/42200.2
*
2024-06-04T09:21:19Z
validation by library/open access desk
1
20.500.12860/42200
2023-07-27T09:34:21Z
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