dc.contributor.author | Huynen, Martijn | |
dc.contributor.author | Waeytens, Ruben | |
dc.contributor.author | Bosman, Dries | |
dc.contributor.author | Gossye, Michiel | |
dc.contributor.author | Rogier, Hendrik | |
dc.contributor.author | Vande Ginste, Dries | |
dc.date.accessioned | 2024-06-04T09:24:41Z | |
dc.date.available | 2023-07-27T09:34:21Z | |
dc.date.available | 2024-06-04T09:24:41Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 2475-9481 | |
dc.identifier.other | WOS:001017586100025 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42200.2 | |
dc.source | WOS | |
dc.title | Reduced-Order Stochastic Testing of Interconnects Subject to Line Edge Roughness | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Huynen, Martijn | |
dc.contributor.imecauthor | Waeytens, Ruben | |
dc.contributor.imecauthor | Bosman, Dries | |
dc.contributor.imecauthor | Gossye, Michiel | |
dc.contributor.imecauthor | Rogier, Hendrik | |
dc.contributor.imecauthor | Vande Ginste, Dries | |
dc.contributor.orcidimec | Huynen, Martijn::0000-0002-5168-9421 | |
dc.contributor.orcidimec | Rogier, Hendrik::0000-0001-8139-2736 | |
dc.contributor.orcidimec | Vande Ginste, Dries::0000-0002-0178-288X | |
dc.date.embargo | 2023-05-10 | |
dc.identifier.doi | 10.1109/SPI57109.2023.10145572 | |
dc.identifier.eisbn | 979-8-3503-3282-7 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | 27th IEEE Workshop on Signal and Power Integrity (SPI) | |
dc.source.conferencedate | MAY 07-10, 2023 | |
dc.source.conferencelocation | Aveiro | |
dc.source.journal | N/A | |
imec.availability | Published - open access | |