Browsing Conference contributions by imec author "198d593ad102a4c8ca4f42d081dd0374bb0eb0be"
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Analysis of the Influence of Roughness on the Propagation Constant of a Waveguide via Two Sparse Stochastic Methods
Waeytens, Ruben; Bosman, Dries; Huynen, Martijn; Gossye, Michiel; Rogier, Hendrik; Vande Ginste, Dries (2020) -
Reduced-Order Stochastic Testing of Interconnects Subject to Line Edge Roughness
Huynen, Martijn; Waeytens, Ruben; Bosman, Dries; Gossye, Michiel; Rogier, Hendrik; Vande Ginste, Dries (2023)