Browsing Conference contributions by imec author "40a3fc1ae934a190e34ba888e6dfea1ea3633994"
Now showing items 1-6 of 6
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Accurate prediction of device performance : Reconstructing 2D-active dopant profiles from 2D-carrier profiles in the presence of extensive mobile carrier diffusion
Nazir, Aftab; Eyben, Pierre; Clarysse, Trudo; Spessot, Alessio; Ritzenthaler, Romain; Schram, Tom; Vandervorst, Wilfried (2014) -
Active dopant profiling of advanced semiconductor devices using scanning spreading resistance microscopy
Mody, Jay; Eyben, Pierre; Polspoel, Wouter; Schulze, Andreas; Nazir, Aftab; Vandervorst, Wilfried (2008) -
Electrical characterization of carbon nanotube based interconnects
Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Dathe, Andre; Nazir, Aftab; Mody, Jay; Celano, Umberto; Ke, Xiaoxing; Vandervorst, Wilfried (2011) -
Sub-nanometer two-dimensional carrier profiling in silicon MOS technologies using high vacuum scanning spreading resistance microscopy
Eyben, Pierre; Mody, Jay; Nazir, Aftab; Schulze, Andreas; Hantschel, Thomas; Vandervorst, Wilfried (2009) -
Two-dimensional carrier mapping at the nanometer-scale on 32nm node targeted p-MOSFETs using high vacuum scanning spreading resistance microscopy
Eyben, Pierre; Clarysse, Trudo; Mody, Jay; Nazir, Aftab; Schulze, Andreas; Hantschel, Thomas; Vandervorst, Wilfried (2011) -
Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations
Nazir, Aftab; Eyben, Pierre; Clarysse, Trudo; Hellings, Geert; Schulze, Andreas; Mody, Jay; De Meyer, Kristin; Vandervorst, Wilfried (2011)