Authors

Nazir, Aftab; Eyben, Pierre; Clarysse, Trudo; Hellings, Geert; Schulze, Andreas; Mody, Jay; De Meyer, Kristin; Vandervorst, Wilfried

Conference

41st European Solid-State Device Research Conference - ESSDERC

Title

Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations

Publication type

Proceedings paper

Embargo date

9999-12-31