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Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations
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1966 since deposited on 2021-10-19
2last month
Acq. date: 2025-12-15
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Metrics
Views
1966 since deposited on 2021-10-19
2last month
Acq. date: 2025-12-15
Citations