Publication:

Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations

Date

2011
Proceedings Paper
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dc.contributor.authorNazir, Aftab
dc.contributor.authorEyben, Pierre
dc.contributor.authorClarysse, Trudo
dc.contributor.authorHellings, Geert
dc.contributor.authorSchulze, Andreas
dc.contributor.authorMody, Jay
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorNazir, Aftab
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.date.accessioned2021-10-19T16:38:44Z
dc.date.available2021-10-19T16:38:44Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19473
dc.source.beginpage135
dc.source.conference41st European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate12/09/2011
dc.source.conferencelocationHelsinki Finland
dc.source.endpage138
dc.title

Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations

dc.typeProceedings paper
dspace.entity.typePublication
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