Browsing Conference contributions by imec author "6eb4df046dfd790219e5da7304bc58f9958db56d"
Now showing items 1-9 of 9
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Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO2 with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier Stacking
Franco, Jacopo; de Marneffe, Jean-Francois; Vandooren, Anne; Kimura, Yosuke; Nyns, Laura; Wu, Zhicheng; El-Sayed, A-M; Jech, M.; Waldhoer, D.; Claes, Dieter; Arimura, Hiroaki; Ragnarsson, Lars-Ake; Afanas'ev, V.; Stesmans, A.; Horiguchi, Naoto; Linten, Dimitri; Grasser, T.; Kaczer, Ben (2020) -
Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications
Zhao, S. E.; Putcha, Vamsi; Bury, Erik; Franco, Jacopo; Walke, Amey; Peralagu, Uthayasankaran; Zhao, Ming; Alian, AliReza; Kaczer, Ben; Waldron, Niamh; Linten, Dimitri; Parvais, Bertrand; Collaert, Nadine (2020) -
Implication of Channel Percolation in Ferroelectric FETs for Threshold Voltage Shift Modeling
Xiang, Yang; Garcia Bardon, Marie; Kaczer, Ben; Alam, Md Nur Kutubul; Ragnarsson, Lars-Ake; Groeseneken, Guido; Van Houdt, Jan (2020) -
On the impact of mechanical stress on gate oxide trapping
Goes, W.; Grasser, T.; Kruv, Anastasiia; Kaczer, Ben; Grill, Alexander; Gonzalez, Mario; Franco, Jacopo; Linten, Dimitri; De Wolf, Ingrid (2020) -
Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs
Makarov, A.; Jech, M.; Tyaginov, Stanislav; Vaisman Chasin, Adrian; Bury, Erik; Vandemaele, Michiel; Grill, Alexander; De Keersgieter, An; Linten, Dimitri; Kaczer, Ben (2020) -
Probing the evolution of electrically active defects in doped ferroelectric HfO2 during wake-up and fatigue
Celano, Umberto; Chen, Yi-Hsuan; Minj, Albert; Banerjee, Kaustuv; Ronchi, Nicolo; McMitchell, Sean; Van Marcke, Patricia; Favia, Paola; Wu, T. L.; Kaczer, Ben; Van den Bosch, Geert; Van Houdt, Jan; van der Heide, Paul (2020) -
Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures
Michl, J.; Grill, A.; Claes, D.; Rzepa, G.; Kaczer, B.; Linten, D.; Radu, I; Grasser, T.; Waltl, M. (2020) -
Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures
Michl, J.; Grasser, T.; Waltl, M.; Grill, Alexander; Bury, Erik; Tyaginov, Stanislav; Linten, Dimitri; Parvais, Bertrand; Kaczer, Ben; Radu, Iuliana (2020) -
The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release
Grasser, T.; Rzepa, G.; Stampfer, B.; Waltl, M.; Kaczer, Ben; O'Sullivan, Barry (2020)