Browsing Conference contributions by author "Wagner, Matthias"
Now showing items 1-2 of 2
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Failure and stress analysis of Cu TSVs using
De Wolf, Ingrid; Khaled, Ahmad; Herms, Martin; Wagner, Matthias; Djuric, Tatjana; Czurratis, Peter; Brand, Sebastian (2015) -
Photo-elastic characterization of defect structures in mono and multi-crystalline semiconductor materials
Herms, Martin; Wagner, Matthias; Kayser, Stefan; Kießling, Frank; Poklad, Anna; Zhao, Ming; Kretzer, Ulrich (2016-09)