Browsing Conference contributions by author "Qi, Q."

Now showing items 1-1 of 1

Study of electromigration mechanisms in 22nm half-pitch Cu interconnects by 1/f noise measurements

Beyne, Sofie; Croes, Kristof; van der Veen, Marleen; Varela Pedreira, Olalla; Qi, Q.; De Wolf, Ingrid; Tokei, Zsolt (2017)