Browsing Conference contributions by imec author "a5a13b116c72f588ac763b13517a8752417ac34b"
Now showing items 1-20 of 29
-
3D imaging of atom probe tip shapes with atomic force microscopy
Fleischmann, Claudia; Paredis, Kristof; Melkonyan, Davit; Op de Beeck, Jonathan; Bogdanowicz, Janusz; Morris, Richard; Cuduvally, Ramya; Vandervorst, Wilfried (2018) -
3D-carrier profiling and parasitic resistance analysis in vertically stacked gate-all-around Si nanowire CMOS transistors
Eyben, Pierre; Ritzenthaler, Romain; De Keersgieter, An; Chiarella, Thomas; Veloso, Anabela; Mertens, Hans; Pena, Vanessa; Santoro, Gaetano; Machillot, Jerome; Kim, Myungsun; Miyashita, Toshihiko; Yoshida, Naomi; Bender, Hugo; Richard, Olivier; Celano, Umberto; Paredis, Kristof; Wouters, Lennaert; Mitard, Jerome; Horiguchi, Naoto (2019) -
A 3D electrical characterization of single stacking faults in InP by conductive-AFM
Mannarino, Manuel; Celano, Umberto; Lu, Augustin; Chintala, Ravi Chandra; Paredis, Kristof; Vandervorst, Wilfried (2015) -
An innovative probe microscopy solution for measuring conductivity profiles in 3-dimensions
Celano, Umberto; Paredis, Kristof; Humphris, Andrew; Tedaldi, Matt; O'Sullivan, Connor Laharn; Hole, Patrick; Goulden, Jenny (2021) -
APT tip shape imaging by SPM
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; van der Heide, Paul; Vandervorst, Wilfried (2019) -
Combining electrical AFM techniques for the study of exfoliated MoS2 devices
Mascaro, Marco; Celano, Umberto; Balaji, Yashwanth; Ludwig, Jonathan; Paredis, Kristof; Asselberghs, Inge; Radu, Iuliana; Vandervorst, Wilfried (2018) -
Combining TCAD and advanced metrology techniques to support device integration towards N3
Eyben, Pierre; De Keersgieter, An; Celano, Umberto; Wouters, Lennaert; Chiarella, Thomas; Ritzenthaler, Romain; Mertens, Hans; Richard, Olivier; Paredis, Kristof; Matagne, Philippe; Mitard, Jerome; Horiguchi, Naoto; Goux, Ludovic (2021) -
Diamond electrical probes with sub-nanometer spatial resolution for advanced nanoelectronics device characterization
Hantschel, Thomas; Yeghoyan, Taguhi; Paredis, Kristof; Schulze, Andreas; Vandervorst, Wilfried (2016) -
Diamond nanoprobes for electrical probing of nanoelectronics device structures
Hantschel, Thomas; Clarysse, Trudo; Nuytten, Thomas; Paredis, Kristof; Eyben, Pierre; Vandervorst, Wilfried (2013) -
Diamond scanning probes with sub-nanometer resolution for advanced nanoelectronics device characterization
Hantschel, Thomas; Xu, Zheng; Paredis, Kristof; Schulze, Andreas; Vandervorst, Wilfried (2015) -
Diamond tips for electrical AFM measurements with sub-nanometer resolution
Hantschel, Thomas; Tsigkourakos, Menelaos; Paredis, Kristof; Eyben, Pierre; Nuytten, Thomas; Schulze, Andreas; Vandervorst, Wilfried (2014) -
Effects of grain boundaries on the electronic properties of MoS2 layers
Ludwig, Jonathan; Chiappe, Daniele; Mascaro, Marco; Celano, Umberto; Asselberghs, Inge; Radu, Iuliana; van der Heide, Paul; Vandervorst, Wilfried; Paredis, Kristof (2018) -
Electrical atomic force microscopy for 2D transition metal dichalcogenide materials
Celano, Umberto; Virkki, Olli; Mascaro, Marco; Nalin Mehta, Ankit; Bender, Hugo; Chiappe, Daniele; Asselberghs, Inge; Paredis, Kristof; Hoflijk, Ilse; Franquet, Alexis; Huyghebaert, Cedric; Radu, Iuliana; Vandervorst, Wilfried (2017) -
Exploring the impact of confinement in Spreading Resistance Microscopy Analysis
Pandey, Komal; Paredis, Kristof; Vandervorst, Wilfried (2017) -
Hedgehog probe tips enabling high-resolution scanning probe microscopy
Boehme, Thijs; Hantschel, Thomas; Wouters, Lennaert; Folkersma, Steven; Paredis, Kristof; Vandervorst, Wilfried (2019) -
Improved atom probe reconstruction through tp shape constraints supplied by scanning probe microscopy
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; van der Heide, Paul; Vandervorst, Wilfried; Geiser, Brian; Bunton, Joe; Ulfig, Robert; Larson, Dave (2020) -
Improving APT-AFM technology: towards high resolution 3D APT tip shapes
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; Vandervorst, Wilfried (2018) -
Individual device analysis using hybrid TEM-scalpel SSRM metrology
Celano, Umberto; Favia, Paola; Drijbooms, Chris; Dixon-Luinenburg, Oberon; Richard, Olivier; Bender, Hugo; Vancoille, Eric; Paredis, Kristof; Loo, Roger; Schulze, Andreas; Hikavyy, Andriy; Witters, Liesbeth; Mitard, Jerome; Collaert, Nadine; Horiguchi, Naoto; Vandervorst, Wilfried (2017) -
Integration of interconnected magnetic tunnel junctions for spin torque majority gates
Wan, Danny; Manfrini, Mauricio; Souriau, Laurent; Sayan, Safak; Jussot, Julien; Swerts, Johan; Rassoul, Nouredine; Babaei Gavan, Khashayar; Wouters, Lennaert; Paredis, Kristof; Huyghebaert, Cedric; Vaysset, Adrien; Thiam, Arame; Ercken, Monique; Wilson, Chris; Mocuta, Dan; Radu, Iuliana (2017) -
Mechanisms of high-pressure tip-induced material removal toward a tomographic AFM
Celano, Umberto; Pandey, Komal; Wouters, Lennaert; Paredis, Kristof; van der Heide, Paul; Vandervorst, Wilfried (2018)