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Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling
dc.contributor.author | Verreck, D. | |
dc.contributor.author | Arreghini, A. | |
dc.contributor.author | Schanovsky, F. | |
dc.contributor.author | Rzepa, G. | |
dc.contributor.author | Stanojevic, Z. | |
dc.contributor.author | Mitterbauer, F. | |
dc.contributor.author | Kernstock, C. | |
dc.contributor.author | Baumgartner, O. | |
dc.contributor.author | Karner, M. | |
dc.contributor.author | Van den Bosch, G. | |
dc.contributor.author | Rosmeulen, M. | |
dc.date.accessioned | 2022-07-09T02:27:43Z | |
dc.date.available | 2022-07-09T02:27:43Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 2380-9248 | |
dc.identifier.other | WOS:000812325400012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40085 | |
dc.source | WOS | |
dc.title | Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Verreck, D. | |
dc.contributor.imecauthor | Arreghini, A. | |
dc.contributor.imecauthor | Van den Bosch, G. | |
dc.contributor.imecauthor | Rosmeulen, M. | |
dc.identifier.doi | 10.1109/IEDM19574.2021.9720506 | |
dc.identifier.eisbn | 978-1-6654-2572-8 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Electron Devices Meeting (IEDM) | |
dc.source.conferencedate | DEC 11-16, 2021 | |
dc.source.conferencelocation | San Francisco | |
imec.availability | Under review |
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