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Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling
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Authors
Verreck, Devin
;
Arreghini, Antonio
;
Schanovsky, F.
;
Rzepa, G.
;
Stanojevic, Z.
;
Mitterbauer, F.
;
Kernstock, C.
;
Baumgartner, O.
;
Karner, M.
;
Van den Bosch, Geert
;
Rosmeulen, Maarten
DOI
10.1109/IEDM19574.2021.9720506
EISBN
978-1-6654-2572-8
ISSN
2380-9248
Conference
IEEE International Electron Devices Meeting (IEDM)
Journal
na
Title
Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling
Publication type
Proceedings paper
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2
20.500.12860/40085.2
*
2022-08-25T15:07:10Z
validation by library/open access desk
1
20.500.12860/40085
2022-07-09T02:27:43Z
*Selected version
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