Browsing by author "Mitterbauer, F."
Now showing items 1-3 of 3
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3D TCAD model for poly-Si channel current and variability in vertical NAND flash memory
Verreck, Devin; Arreghini, Antonio; Schanovsky, Franz; Stanojevic, Zlatan; Steiner, K.; Mitterbauer, F.; Karner, Markus; Van den Bosch, Geert; Furnemont, Arnaud (2019) -
Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies
Rzepa, G.; Karner, M.; Baumgartner, O.; Strof, G.; Schanovsky, F.; Mitterbauer, F.; Kernstock, C.; Karner, H. W.; Stanojevic, Z.; Weckx, Pieter; Hellings, Geert; Claes, Dieter; Wu, Zhicheng; Xiang, Yang; Chiarella, Thomas; Parvais, Bertrand; Mitard, Jerome; Franco, Jacopo; Kaczer, Ben; Linten, Dimitri (2021) -
Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling
Verreck, Devin; Arreghini, Antonio; Schanovsky, F.; Rzepa, G.; Stanojevic, Z.; Mitterbauer, F.; Kernstock, C.; Baumgartner, O.; Karner, M.; Van den Bosch, Geert; Rosmeulen, Maarten (2021)