Publication:

Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling

Date

2021

Proceedings Paper

https://doi.org/10.1109/IEDM19574.2021.9720506

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Author(s)

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Arreghini, Antonio

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Mitterbauer, F.

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Baumgartner, O.

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Van den Bosch, Geert

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Rosmeulen, Maarten

Journal

na

Statistics

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Acq. date: 2026-02-28