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Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling
Publication:
Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling
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Date
2021
Proceedings Paper
https://doi.org/10.1109/IEDM19574.2021.9720506
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verreck, Devin
;
Arreghini, Antonio
;
Schanovsky, F.
;
Rzepa, G.
;
Stanojevic, Z.
;
Mitterbauer, F.
;
Kernstock, C.
;
Baumgartner, O.
;
Karner, M.
;
Van den Bosch, Geert
;
Rosmeulen, Maarten
Journal
na
Abstract
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1716
since deposited on 2022-07-09
Acq. date: 2025-12-10
Citations
Metrics
Views
1716
since deposited on 2022-07-09
Acq. date: 2025-12-10
Citations