Browsing by author "Schanovsky, F."
Now showing items 1-11 of 11
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A TCAD Compatible SONOS Trapping Layer Model for Accurate Programming Dynamics
Schanovsky, F.; Rzepa, G.; Stanojevic, Z.; Kernstock, C.; Baumgartner, O.; Karner, M.; Verreck, Devin; Arreghini, Antonio; Rosmeulen, Maarten (2021) -
Advanced characterization of oxide traps: the dynamic time-dependent defect spectroscopy
Grasser, Tibor; Rott, K.; Reisinger, H.; Wagner, P.J.; Goes, W; Schanovsky, F.; Waltl, M.; Toledano Luque, Maria; Kaczer, Ben (2013) -
Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors
Grasser, T.; Stampfer, B.; Waltl, M.; Rzepa, G.; Rupp, K.; Schanovsky, F.; Pobegen, G.; Puschkarsky, K.; Reisinger, H.; O'Sullivan, Barry; Kaczer, Ben (2018) -
Direct tunneling and gate current fluctuations
Baumgartner, O.; Bina, M.; Goes, W.; Schanovsky, F.; Toledano Luque, Maria; Kaczer, Ben; Kosina, H.; Grasser, Tibor (2013) -
Hydrogen-related volatile defects as the possible cause for the recoverable component of NBTI
Grasser, T.; Rott, K.; Reisinger, H.; Waltl, M.; Wagner, P.; Schanovsky, F.; Goes, W.; Pobegen, G.; Kaczer, Ben (2013) -
Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation
Schanovsky, F.; Verreck, Devin; Stanojevic, Z.; Schallert, S.; Arreghini, Antonio; Van den Bosch, Geert; Rosmeulen, Maarten; Karner, M. (2024) -
Multiphonon processes as the origin of reliability issues
Goes, Wolfgang; Toledano Luque, Maria; Schanovsky, F.; Bina, M.; Baumgartner, O.; Kaczer, Ben; Grasser, Tibor (2013) -
NBTI in nanoscale MOSFETs – The ultimate modeling menchmark
Grasser, T.; Rott, K.; Reisinger, H.; Waltl, M.; Schanovsky, F.; Kaczer, Ben (2014) -
Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies
Rzepa, G.; Karner, M.; Baumgartner, O.; Strof, G.; Schanovsky, F.; Mitterbauer, F.; Kernstock, C.; Karner, H. W.; Stanojevic, Z.; Weckx, Pieter; Hellings, Geert; Claes, Dieter; Wu, Zhicheng; Xiang, Yang; Chiarella, Thomas; Parvais, Bertrand; Mitard, Jerome; Franco, Jacopo; Kaczer, Ben; Linten, Dimitri (2021) -
Understanding correlated drain and gate current fluctuations
Goes, W.; Toledano Luque, Maria; Baumgartner, O.; Bina, M.; Schanovsky, F.; Kaczer, Ben; Grasser, T. (2013) -
Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling
Verreck, Devin; Arreghini, Antonio; Schanovsky, F.; Rzepa, G.; Stanojevic, Z.; Mitterbauer, F.; Kernstock, C.; Baumgartner, O.; Karner, M.; Van den Bosch, Geert; Rosmeulen, Maarten (2021)