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Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation
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Authors
Schanovsky, F.
;
Verreck, Devin
;
Stanojevic, Z.
;
Schallert, S.
;
Arreghini, Antonio
;
Van den Bosch, Geert
;
Rosmeulen, Maarten
;
Karner, M.
DOI
10.1109/TED.2023.3339076
ISSN
0018-9383
Issue
1
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume
71
Title
Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation
Publication type
Journal article
Embargo date
2023-12-18
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2
20.500.12860/43341.2
*
2024-02-26T13:22:42Z
validation by library/open access desk
1
20.500.12860/43341
2024-01-07T17:44:24Z
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