Browsing by author "Arreghini, Antonio"

3D TCAD model for poly-Si channel current and variability in vertical NAND flash memory

Verreck, Devin; Arreghini, Antonio; Schanovsky, Franz; Stanojevic, Zlatan; Steiner, K.; Mitterbauer, F.; Karner, Markus; Van den Bosch, Geert; Furnemont, Arnaud (2019)

A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations

Padovani, Andrea; Arreghini, Antonio; Vandelli, Luca; Larcher, Luca; Van den Bosch, Geert; Pavan, Paolo; Van Houdt, Jan (2011)

A consistent model for oxide trap profiling with the trap spectroscopy by charge injection and sensing (TSCIS) technique

Cho, Moon Ju; Degraeve, Robin; Roussel, Philippe; Govoreanu, Bogdan; Kaczer, Ben; Zahid, Mohammed; Simoen, Eddy; Arreghini, Antonio; Jurczak, Gosia; Van Houdt, Jan; Groeseneken, Guido (2010)

A methodology for mechanical stress and wafer warpage minimization during 3D NAND fabrication

Kruv, Anastasiia; Gonzalez, Mario; Okudur, Oguzhan Orkut; Spampinato, Valentina; Franquet, Alexis; Vadakupudhu Palayam, Senthil; Arreghini, Antonio; Van den Bosch, Geert; Rosmeulen, Maarten; De Wolf, Ingrid (2022)

A Novel Ni-Al Alloy Metal Induced Lateral Crystallization Process for Improved Channel Conduction in 3-D NAND Flash

Ramesh, Siva; Banerjee, Kaustuv; Opsomer, Karl; Rachita, Iuliana; Bastos, Joao; Soulie, Jean-Philippe; Sebaai, Farid; Favia, Paola; Korytov, Maxim; Richard, Olivier; Breuil, Laurent; Arreghini, Antonio; Van den Bosch, Geert; Rosmeulen, Maarten (2022)

A proper approach to characterize retention-after-cycling in 3D-Flash devices

Qiao, Fengying; Arreghini, Antonio; Blomme, Pieter; Van den Bosch, Geert; Pan, Liyang; Xu, Jun; Van Houdt, Jan (2013)

A TCAD Compatible SONOS Trapping Layer Model for Accurate Programming Dynamics

Schanovsky, F.; Rzepa, G.; Stanojevic, Z.; Kernstock, C.; Baumgartner, O.; Karner, M.; Verreck, Devin; Arreghini, Antonio; Rosmeulen, Maarten (2021)

An inner gate as enabler for vertical pitch scaling in macaroni channel gate-all-around 3-D NAND flash memory

Verreck, Devin; Arreghini, Antonio; Van den Bosch, Geert; Rosmeulen, Maarten (2023)

Analysis of performance/variability trade-off in Macaroni-type 3-D NAND Memory

Congedo, Gabriele; Arreghini, Antonio; Liu, Lifang; Capogreco, Elena; Lisoni, Judit; Huet, Karim; Toque-Tresonne, Ines; Van Aerde, Steven; Toledano Luque, Maria; Tan, Chi Lim; Van den Bosch, Geert; Van Houdt, Jan (2014)

Application of single pulse dynamics to model program anderase cycling-induced defects in the tunnel oxide of charge-trapping devices

Bastos, Joao; Arreghini, Antonio; Verreck, Devin; Schanovsky, Franz; Degraeve, Robin; Linten, Dimitri; Van den Bosch, Geert; Furnemont, Arnaud (2019)

Assessment methodology of the lateral migration component in data retention of 3D SONOS memories

Liu, Lifang; Arreghini, Antonio; Van den Bosch, Geert; Liyang, Pan; Van Houdt, Jan (2014)

Assessment of tunnel oxide and poly-Si channel traps in 3D SONOS memory before and after P/E cycling

Lee, Ko-Hui; Degraeve, Robin; Toledano Luque, Maria; Arreghini, Antonio; Breuil, Laurent; Blomme, Pieter; Van den Bosch, Geert; Van Houdt, Jan (2015)

At the Extreme of 3D-NAND Scaling: 25 nm Z-Pitch with 10 nm Word Line Cells

Rachidi, Sana; Arreghini, Antonio; Verreck, Devin; Donadio, Gabriele Luca; Banerjee, Kaustuv; Katcko, Kostantine; Oniki, Yusuke; Van den Bosch, Geert; Rosmeulen, Maarten (2022)

Channel and gate stack charge trapping investigation in vertical 3D NAND devices with poly-silicon channel

Subirats, Alexandre; Arreghini, Antonio; Breuil, Laurent; Degraeve, Robin; Van den Bosch, Geert; Linten, Dimitri; Furnemont, Arnaud (2017)

Channel and near channel defects characterization in vertical InxGa1-xAs high mobility channels for future 3D NAND memory

Subirats, Alexandre; Capogreco, Elena; Degraeve, Robin; Arreghini, Antonio; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan; Furnemont, Arnaud (2016)

Characterizing grain size and defect energy distribution in vertical SONOS poly-Si channels by means of a resistive network model

Degraeve, Robin; Toledano Luque, Maria; Arreghini, Antonio; Tang, Baojun; Capogreco, Elena; Lisoni, Judit; Roussel, Philippe; Kaczer, Ben; Van den Bosch, Geert; Groeseneken, Guido; Van Houdt, Jan (2013)

Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices

Maconi, Alessandro; Arreghini, Antonio; Monzio Compagnoni, Christian; Van den Bosch, Geert; Spinelli, Alessandro S.; Van Houdt, Jan; Lacaita, Andrea L. (2012)