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Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation
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Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation
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Date
2024
Journal article
https://doi.org/10.1109/TED.2023.3339076
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schanovsky, F.
;
Verreck, Devin
;
Stanojevic, Z.
;
Schallert, S.
;
Arreghini, Antonio
;
Van den Bosch, Geert
;
Rosmeulen, Maarten
;
Karner, M.
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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Downloads
316
since deposited on 2024-01-07
32
last month
6
last week
Acq. date: 2025-12-11
Views
873
since deposited on 2024-01-07
3
last month
Acq. date: 2025-12-11
Citations