Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation

Schanovsky, F.; Verreck, Devin; Stanojevic, Z.; Schallert, S.; Arreghini, Antonio; Van den Bosch, Geert; Rosmeulen, Maarten; Karner, M.

doi:10.1109/TED.2023.3339076

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Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation

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2024

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https://doi.org/10.1109/TED.2023.3339076

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IEEE TRANSACTIONS ON ELECTRON DEVICES

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Acq. date: 2026-01-08

873 since deposited on 2024-01-07

Acq. date: 2026-01-08

Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation

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