Publication:

Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation

Date

2024
Journal article
https://doi.org/10.1109/TED.2023.3339076
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dc.contributor.authorSchanovsky, F.
dc.contributor.authorVerreck, Devin
dc.contributor.authorStanojevic, Z.
dc.contributor.authorSchallert, S.
dc.contributor.authorArreghini, Antonio
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorRosmeulen, Maarten
dc.contributor.authorKarner, M.
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorRosmeulen, Maarten
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecRosmeulen, Maarten::0000-0002-3663-7439
dc.date.accessioned2024-02-26T13:29:28Z
dc.date.available2024-01-07T17:44:24Z
dc.date.available2024-02-26T13:29:28Z
dc.date.embargo2023-12-18
dc.date.issued2024
dc.identifier.doi10.1109/TED.2023.3339076
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43341
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage547
dc.source.endpage553
dc.source.issue1
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages7
dc.source.volume71
dc.subject.keywordsTRANSPORT
dc.subject.keywordsDEVICES
dc.title

Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation

dc.typeJournal article
dspace.entity.typePublication
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