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Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation
Publication:
Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation
Date
2024
Journal article
https://doi.org/10.1109/TED.2023.3339076
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2.89 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schanovsky, F.
;
Verreck, Devin
;
Stanojevic, Z.
;
Schallert, S.
;
Arreghini, Antonio
;
Van den Bosch, Geert
;
Rosmeulen, Maarten
;
Karner, M.
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Abstract
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since deposited on 2024-01-07
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Downloads
261
since deposited on 2024-01-07
163
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Views
868
since deposited on 2024-01-07
408
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations