Publication:

Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation

Date

2024
Journal article
https://doi.org/10.1109/ted.2023.3339076
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Published version 2.89 MB

Author(s)

Schanovsky, F.
;
Verreck, Devin  
;
Stanojevic, Z.
;
Schallert, S.
;
Arreghini, Antonio  
;
Van den Bosch, Geert  
;
Rosmeulen, Maarten  
;
Karner, M.

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

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799 since deposited on 2024-01-07
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