Browsing by author "Baumgartner, O."
Now showing items 1-9 of 9
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A comprehensive model for correlated drain and gate current fluctuations
Goes, Wolfgang; Toledano Luque, Maria; Baumgartner, O.; Schanovsky, Frank; Kaczer, Ben; Grasser, Tibor (2013) -
A TCAD Compatible SONOS Trapping Layer Model for Accurate Programming Dynamics
Schanovsky, F.; Rzepa, G.; Stanojevic, Z.; Kernstock, C.; Baumgartner, O.; Karner, M.; Verreck, Devin; Arreghini, Antonio; Rosmeulen, Maarten (2021) -
Direct tunneling and gate current fluctuations
Baumgartner, O.; Bina, M.; Goes, W.; Schanovsky, F.; Toledano Luque, Maria; Kaczer, Ben; Kosina, H.; Grasser, Tibor (2013) -
Monolithic TCAD simulation of phase-change memory (PCM/PRAM) plus Ovonic Threshold Switch (OTS) selector device
Thesberg, M.; Stanojevic, Z.; Baumgartner, O.; Kernstock, C.; Leonelli, D.; Barci, M.; Wang, X.; Zhou, X.; Jiao, H.; Donadio, Gabriele Luca; Garbin, Daniele; Witters, Thomas; Kundu, Shreya; Hody, Hubert; Delhougne, Romain; Kar, Gouri Sankar; Karner, M. (2023) -
Multiphonon processes as the origin of reliability issues
Goes, Wolfgang; Toledano Luque, Maria; Schanovsky, F.; Bina, M.; Baumgartner, O.; Kaczer, Ben; Grasser, Tibor (2013) -
Quantum-mechanical modeling of NBTI in High-k SiGe MOSFETs
Hehenberger, Philipp; Goes, Wolfgang; Baumgartner, O.; Franco, Jacopo; Kaczer, Ben; Grasser, Tibor (2011) -
Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies
Rzepa, G.; Karner, M.; Baumgartner, O.; Strof, G.; Schanovsky, F.; Mitterbauer, F.; Kernstock, C.; Karner, H. W.; Stanojevic, Z.; Weckx, Pieter; Hellings, Geert; Claes, Dieter; Wu, Zhicheng; Xiang, Yang; Chiarella, Thomas; Parvais, Bertrand; Mitard, Jerome; Franco, Jacopo; Kaczer, Ben; Linten, Dimitri (2021) -
Understanding correlated drain and gate current fluctuations
Goes, W.; Toledano Luque, Maria; Baumgartner, O.; Bina, M.; Schanovsky, F.; Kaczer, Ben; Grasser, T. (2013) -
Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling
Verreck, Devin; Arreghini, Antonio; Schanovsky, F.; Rzepa, G.; Stanojevic, Z.; Mitterbauer, F.; Kernstock, C.; Baumgartner, O.; Karner, M.; Van den Bosch, Geert; Rosmeulen, Maarten (2021)