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Understanding the factors affecting contact resistance in nanowire field effect transistors (NWFETs) to improve nanoscale contacts for future scaling
Publication:
Understanding the factors affecting contact resistance in nanowire field effect transistors (NWFETs) to improve nanoscale contacts for future scaling
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Date
2022
Journal article
https://doi.org/10.1063/5.0092535
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ramesh, Siva
;
Ivanov, Tsvetan
;
Sibaja-Hernandez, Arturo
;
Alian, AliReza
;
Camerotto, Elisabeth
;
Milenin, Alexey
;
Pinna, Nicolo
;
El Kazzi, S.
;
Lin, Dennis
;
Lagrain, Pieter
;
Favia, Paola
;
Bender, Hugo
;
Collaert, Nadine
;
De Meyer, K.
Journal
JOURNAL OF APPLIED PHYSICS
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Downloads
358
since deposited on 2022-07-28
35
last month
3
last week
Acq. date: 2026-01-09
Views
1664
since deposited on 2022-07-28
1
last month
1
last week
Acq. date: 2026-01-09
Citations