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Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs
dc.contributor.author | Wu, Lizhou | |
dc.contributor.author | Rao, Siddharth | |
dc.contributor.author | Taouil, Mottaqiallah | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.author | Hamdioui, Said | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.date.accessioned | 2022-08-23T02:32:57Z | |
dc.date.available | 2022-08-23T02:32:57Z | |
dc.date.issued | 2022-SEPT 1 | |
dc.identifier.issn | 0018-9340 | |
dc.identifier.other | WOS:000838669200017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40291 | |
dc.source | WOS | |
dc.title | Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Rao, Siddharth | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.identifier.doi | 10.1109/TC.2021.3125228 | |
dc.source.numberofpages | 15 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2219 | |
dc.source.endpage | 2233 | |
dc.source.journal | IEEE TRANSACTIONS ON COMPUTERS | |
dc.source.issue | 9 | |
dc.source.volume | 71 | |
imec.availability | Under review |
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