dc.contributor.author | Santos, Andreia | |
dc.contributor.author | Kosma, Vasiliki | |
dc.contributor.author | Vandereyken, Jelle | |
dc.contributor.author | Marhfour, H. | |
dc.contributor.author | Tanaka, Y. | |
dc.contributor.author | Harumoto, M. | |
dc.contributor.author | Asai, M. | |
dc.contributor.author | Stokes, H. | |
dc.contributor.author | Suh, Hyo Seon | |
dc.contributor.author | Foubert, Philippe | |
dc.contributor.author | De Simone, Danilo | |
dc.date.accessioned | 2022-09-08T15:24:27Z | |
dc.date.available | 2022-09-08T02:39:17Z | |
dc.date.available | 2022-09-08T15:24:27Z | |
dc.date.issued | 2021 | |
dc.identifier.isbn | 978-1-5106-4057-3 | |
dc.identifier.issn | 0277-786X | |
dc.identifier.other | WOS:000844537900014 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40388.2 | |
dc.source | WOS | |
dc.title | EUV lithographic process enablement with novel litho track hardware | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Kosma, Vasiliki | |
dc.contributor.imecauthor | Vandereyken, Jelle | |
dc.contributor.imecauthor | Suh, Hyo Seon | |
dc.contributor.imecauthor | Foubert, Philippe | |
dc.contributor.imecauthor | De Simone, Danilo | |
dc.contributor.orcidimec | De Simone, Danilo::0000-0003-3927-5207 | |
dc.identifier.doi | 10.1117/12.2584515 | |
dc.identifier.eisbn | 978-1-5106-4058-0 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 116120M | |
dc.source.conference | Conference on Advances in Patterning Materials and Processes XXXVIII Part of SPIE Advanced Lithography Conference | |
dc.source.conferencedate | FEB 22-26, 2021 | |
dc.source.conferencelocation | Virtual | |
dc.source.journal | Proceedings of SPIE | |
dc.source.volume | 11612 | |
imec.availability | Published - imec | |