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Combined Machine Learning Techniques For Characteristics Classification and Threshold Voltage Extraction of Transistors
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Authors
Kocak, Husnu Murat
;
Mitard, Jerome
;
Naskali, Ahmet Teoman
DOI
10.1109/ICMTS50340.2022.9898251
EISBN
978-1-6654-8566-1
ISSN
1071-9032
Conference
34th IEEE International Conference on Microelectronic Test Structures (ICMTS)
Journal
na
Title
Combined Machine Learning Techniques For Characteristics Classification and Threshold Voltage Extraction of Transistors
Publication type
Proceedings paper
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3
20.500.12860/40811.3
*
2023-04-26T09:29:26Z
validation by library/open access desk
1
20.500.12860/40811
2022-12-01T03:12:29Z
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