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Determination of layer morphology of rough layers in organic light emitting diodes by X-ray reflectivity
Publication:
Determination of layer morphology of rough layers in organic light emitting diodes by X-ray reflectivity
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Date
2023
Journal article
https://doi.org/10.1002/eng2.12594
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sachs, Ian
;
Fuhrmann, Marc
;
Deferme, Wim
;
Moebius, Hildegard
Journal
ENGINEERING REPORTS
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212
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1295
since deposited on 2022-12-17
Acq. date: 2025-12-13
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Metrics
Downloads
212
since deposited on 2022-12-17
31
last month
7
last week
Acq. date: 2025-12-13
Views
1295
since deposited on 2022-12-17
Acq. date: 2025-12-13
Citations