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Characterisation of porous dielectric films by ellipsometric porosimetry
Publication:
Characterisation of porous dielectric films by ellipsometric porosimetry
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Date
2000
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Baklanov, Mikhaïl
;
Mogilnikov, K. P.
Journal
Optica Applicata
Abstract
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1923
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
1923
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-11
Citations