Publication:

Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs

Date

2022-05-02
Proceedings Paper
https://doi.org/10.1109/IRPS48227.2022.9764470
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Accepted version 2.42 MB
Published version 3.11 MB

Author(s)

Vandemaele, Michiel  
;
Kaczer, Ben  
;
Tyaginov, Stanislav  
;
Bury, Erik  
;
Vaisman Chasin, Adrian  
;
Franco, Jacopo  
;
Makarov, Alexander  
;
Mertens, Hans  
;
Hellings, Geert  
;
Groeseneken, Guido  

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na

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