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Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks
dc.contributor.author | Truijen, B. | |
dc.contributor.author | O'Sullivan, B. | |
dc.contributor.author | Alam, Md Nur K. | |
dc.contributor.author | Claes, D. | |
dc.contributor.author | Thesberg, M. | |
dc.contributor.author | Roussel, P. | |
dc.contributor.author | Chasin, A. | |
dc.contributor.author | Van den Bosch, G. | |
dc.contributor.author | Kaczer, B. | |
dc.contributor.author | Van Houdt, J. | |
dc.date.accessioned | 2023-02-27T03:28:20Z | |
dc.date.available | 2023-02-27T03:28:20Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000922926400168 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41176 | |
dc.source | WOS | |
dc.title | Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Truijen, B. | |
dc.contributor.imecauthor | O'Sullivan, B. | |
dc.contributor.imecauthor | Alam, Md Nur K. | |
dc.contributor.imecauthor | Claes, D. | |
dc.contributor.imecauthor | Roussel, P. | |
dc.contributor.imecauthor | Chasin, A. | |
dc.contributor.imecauthor | Van den Bosch, G. | |
dc.contributor.imecauthor | Kaczer, B. | |
dc.contributor.imecauthor | Van Houdt, J. | |
dc.identifier.doi | 10.1109/IRPS48227.2022.9764603 | |
dc.identifier.eisbn | 978-1-6654-7950-9 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | MAR 27-31, 2022 | |
dc.source.conferencelocation | Dallas | |
imec.availability | Under review |
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