dc.contributor.author | Hsieh, Ping-Yi | |
dc.contributor.author | Tsiara, Artemisia | |
dc.contributor.author | O'Sullivan, Barry | |
dc.contributor.author | Yudistira, Didit | |
dc.contributor.author | Baryshnikova, Marina | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Kunert, Bernardette | |
dc.contributor.author | Pantouvaki, Marianna | |
dc.contributor.author | Van Campenhout, Joris | |
dc.contributor.author | De Wolf, Ingrid | |
dc.date.accessioned | 2023-04-12T10:37:33Z | |
dc.date.available | 2023-02-27T03:28:48Z | |
dc.date.available | 2023-03-03T14:02:11Z | |
dc.date.available | 2023-04-12T10:37:33Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000922926400162 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41187.3 | |
dc.source | WOS | |
dc.title | Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically Integrated on Silicon | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Hsieh, Ping-Yi | |
dc.contributor.imecauthor | Tsiara, Artemisia | |
dc.contributor.imecauthor | O'Sullivan, Barry | |
dc.contributor.imecauthor | Yudistira, Didit | |
dc.contributor.imecauthor | Baryshnikova, Marina | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Kunert, Bernardette | |
dc.contributor.imecauthor | Pantouvaki, Marianna | |
dc.contributor.imecauthor | Van Campenhout, Joris | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.orcidimec | Hsieh, Ping-Yi::0000-0003-4173-3799 | |
dc.contributor.orcidimec | Tsiara, Artemisia::0000-0002-5612-6468 | |
dc.contributor.orcidimec | O'Sullivan, Barry::0000-0002-9036-8241 | |
dc.contributor.orcidimec | Baryshnikova, Marina::0000-0002-5945-4459 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.contributor.orcidimec | Kunert, Bernardette::0000-0002-8986-4109 | |
dc.contributor.orcidimec | Van Campenhout, Joris::0000-0003-0778-2669 | |
dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
dc.date.embargo | 2022-07-01 | |
dc.identifier.doi | 10.1109/IRPS48227.2022.9764597 | |
dc.identifier.eisbn | 978-1-6654-7950-9 | |
dc.source.numberofpages | 9 | |
dc.source.peerreview | yes | |
dc.source.conference | na | |
dc.source.conferencedate | MAR 27-31, 2022 | |
dc.source.conferencelocation | Dallas | |
dc.source.journal | IEEE International Reliability Physics Symposium (IRPS) | |
imec.availability | Published - open access | |
dc.description.wosFundingText | This work was supported by imec's industrial affiliation R&D program on Optical I/O. In particular, Han Han and Olivier Richard of the MCA group are acknowledged for FIB specimen preparation and TEM/EDS analysis. The authors would like to thank participants of imec's Monolithic III-V ART for OIO Meeting and members of the REL group for invaluable input. | |