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A new exploration of quality testing technique for the wafer-scale graphene film based on the terahertz vector network analysis technology
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Authors
Chen, Cheng
;
Pourkazemi, Ali
;
Zhao, Wu
;
Van den Brande, Niko
;
Hauffman, Tom
;
Zhang, Zhiyong
;
Stiens, Johan
DOI
10.1016/j.apsusc.2023.156498
ISSN
0169-4332
Issue
April
Journal
APPLIED SURFACE SCIENCE
Volume
616
Title
A new exploration of quality testing technique for the wafer-scale graphene film based on the terahertz vector network analysis technology
Publication type
Journal article
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2
20.500.12860/41201.2
*
2023-07-05T15:16:12Z
validation by library/open access desk
1
20.500.12860/41201
2023-02-28T03:29:47Z
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