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Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques

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Acq. date: 2026-09-21

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Acq. date: 2026-09-21

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3 since deposited on 2023-03-27
Acq. date: 2026-09-21

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1065 since deposited on 2023-03-27
4last month
1last week
Acq. date: 2026-09-21

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