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dc.contributor.authorVega-Gonzalez, V.
dc.contributor.authorRadisic, D.
dc.contributor.authorChoudhury, S.
dc.contributor.authorTierno, D.
dc.contributor.authorThiam, A.
dc.contributor.authorBatuk, D.
dc.contributor.authorMartinez, G. T.
dc.contributor.authorSeidel, F.
dc.contributor.authorDecoster, S.
dc.contributor.authorKundu, S.
dc.contributor.authorTsvetanova, D.
dc.contributor.authorPeter, A.
dc.contributor.authorde Coster, H.
dc.contributor.authorSepulveda-Marquez, A.
dc.contributor.authorAltamirano-Sanchez, E.
dc.contributor.authorChan, B. T.
dc.contributor.authorDrissi, Y.
dc.contributor.authorSherazi, Y.
dc.contributor.authorUk-Lee, J.
dc.contributor.authorCiofi, I.
dc.contributor.authorMurdoch, G.
dc.contributor.authorNagesh, N.
dc.contributor.authorHellings, G.
dc.contributor.authorRyckaert, J.
dc.contributor.authorBiesemans, S.
dc.contributor.authorLitta, E. Dentoni
dc.contributor.authorHoriguchi, N.
dc.contributor.authorPark, S.
dc.contributor.authorTokei, Zs.
dc.date.accessioned2023-05-25T20:20:00Z
dc.date.available2023-05-25T20:20:00Z
dc.date.issued2022
dc.identifier.issn2380-9248
dc.identifier.otherWOS:000968800700139
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41616
dc.sourceWOS
dc.titleSemi-damascene Integration of a 2-layer MOL VHV Scaling Booster to Enable 4-track Standard Cells
dc.typeProceedings paper
dc.contributor.imecauthorVega-Gonzalez, V.
dc.contributor.imecauthorRadisic, D.
dc.contributor.imecauthorChoudhury, S.
dc.contributor.imecauthorTierno, D.
dc.contributor.imecauthorThiam, A.
dc.contributor.imecauthorBatuk, D.
dc.contributor.imecauthorMartinez, G. T.
dc.contributor.imecauthorSeidel, F.
dc.contributor.imecauthorDecoster, S.
dc.contributor.imecauthorKundu, S.
dc.contributor.imecauthorTsvetanova, D.
dc.contributor.imecauthorPeter, A.
dc.contributor.imecauthorde Coster, H.
dc.contributor.imecauthorSepulveda-Marquez, A.
dc.contributor.imecauthorAltamirano-Sanchez, E.
dc.contributor.imecauthorChan, B. T.
dc.contributor.imecauthorDrissi, Y.
dc.contributor.imecauthorSherazi, Y.
dc.contributor.imecauthorUk-Lee, J.
dc.contributor.imecauthorCiofi, I.
dc.contributor.imecauthorMurdoch, G.
dc.contributor.imecauthorNagesh, N.
dc.contributor.imecauthorHellings, G.
dc.contributor.imecauthorRyckaert, J.
dc.contributor.imecauthorBiesemans, S.
dc.contributor.imecauthorLitta, E. Dentoni
dc.contributor.imecauthorHoriguchi, N.
dc.contributor.imecauthorPark, S.
dc.contributor.imecauthorTokei, Zs.
dc.identifier.doi10.1109/IEDM45625.2022.10019483
dc.identifier.eisbn978-1-6654-8959-1
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.conferenceInternational Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 03-07, 2022
dc.source.conferencelocationSan Francisco
imec.availabilityUnder review


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