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Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy

dc.contributor.authorWu, Zhicheng
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorFranco, Jacopo
dc.contributor.authorSubhechha, Subhali
dc.contributor.authorDekkers, Harold
dc.contributor.authorYengula Venkata Ramana, Bhuvaneshwari
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorRassoul, Nouredine
dc.contributor.authorvan Setten, Michiel
dc.contributor.authorAfanas'ev, V.
dc.contributor.authorDelhougne, Romain
dc.contributor.authorKaczer, Ben
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2023-06-01T12:28:42Z
dc.date.available2023-05-25T20:20:02Z
dc.date.available2023-06-01T12:28:42Z
dc.date.issued2022
dc.identifier.issn2380-9248
dc.identifier.otherWOS:000968800700110
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41624.2
dc.sourceWOS
dc.titleCharacterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy
dc.typeProceedings paper
dc.contributor.imecauthorWu, Zhicheng
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorSubhechha, Subhali
dc.contributor.imecauthorDekkers, Harold
dc.contributor.imecauthorYengula Venkata Ramana, Bhuvaneshwari
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorRassoul, Nouredine
dc.contributor.imecauthorvan Setten, Michiel
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecSubhechha, Subhali::0000-0002-1960-5136
dc.contributor.orcidimecDekkers, Harold::0000-0003-4778-5709
dc.contributor.orcidimecRassoul, Nouredine::0000-0001-9489-3396
dc.contributor.orcidimecvan Setten, Michiel::0000-0003-0557-5260
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.identifier.doi10.1109/IEDM45625.2022.10019454
dc.identifier.eisbn978-1-6654-8959-1
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.conferenceInternational Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 03-07, 2022
dc.source.conferencelocationSan Francisco
dc.source.journalna
imec.availabilityPublished - imec


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220.500.12860/41624.2*2023-06-01T12:23:29Zvalidation by library/open access desk
120.500.12860/416242023-05-25T20:20:02Z

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