Publication:

Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy

Date

2022
Proceedings Paper
https://doi.org/10.1109/iedm45625.2022.10019454
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Author(s)

Wu, Zhicheng  
;
Vaisman Chasin, Adrian  
;
Franco, Jacopo  
;
Subhechha, Subhali  
;
Dekkers, Harold  
;
Yengula Venkata Ramana, Bhuvaneshwari  
;
Belmonte, Attilio  
;
Rassoul, Nouredine  
;
van Setten, Michiel  
;
Afanas'ev, V.
;
Delhougne, Romain  
;
Kaczer, Ben  
;
Kar, Gouri Sankar  

Journal

na

Abstract

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1386 since deposited on 2023-05-25
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Acq. date: 2026-07-16

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