Publication:

Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy

Date

2022

Proceedings Paper

https://doi.org/10.1109/IEDM45625.2022.10019454

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Author(s)

;

Vaisman Chasin, Adrian

;

;

Subhechha, Subhali

;

Dekkers, Harold

;

Yengula Venkata Ramana, Bhuvaneshwari

;

Belmonte, Attilio

;

Rassoul, Nouredine

;

van Setten, Michiel

;

;

Delhougne, Romain

;

;

Kar, Gouri Sankar

Journal

na

Statistics

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Acq. date: 2026-04-26