Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy
Publication:
Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy
Date
2022
Proceedings Paper
https://doi.org/10.1109/IEDM45625.2022.10019454
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Zhicheng
;
Vaisman Chasin, Adrian
;
Franco, Jacopo
;
Subhechha, Subhali
;
Dekkers, Harold
;
Yengula Venkata Ramana, Bhuvaneshwari
;
Belmonte, Attilio
;
Rassoul, Nouredine
;
van Setten, Michiel
;
Afanas'ev, V.
;
Delhougne, Romain
;
Kaczer, Ben
;
Kar, Gouri Sankar
Journal
na
Abstract
Description
Metrics
Views
1376
since deposited on 2023-05-25
Acq. date: 2025-10-23
Citations
Metrics
Views
1376
since deposited on 2023-05-25
Acq. date: 2025-10-23
Citations