Publication:
Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy
Loading...
Journal
Abstract
Description
Metrics
Views
1379 since deposited on 2023-05-25
2last month
Acq. date: 2025-12-08
Citations
Metrics
Views
1379 since deposited on 2023-05-25
2last month
Acq. date: 2025-12-08
Citations