Publication:
Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy
| dc.contributor.author | Wu, Zhicheng | |
| dc.contributor.author | Vaisman Chasin, Adrian | |
| dc.contributor.author | Franco, Jacopo | |
| dc.contributor.author | Subhechha, Subhali | |
| dc.contributor.author | Dekkers, Harold | |
| dc.contributor.author | Yengula Venkata Ramana, Bhuvaneshwari | |
| dc.contributor.author | Belmonte, Attilio | |
| dc.contributor.author | Rassoul, Nouredine | |
| dc.contributor.author | van Setten, Michiel | |
| dc.contributor.author | Afanas'ev, V. | |
| dc.contributor.author | Delhougne, Romain | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Kar, Gouri Sankar | |
| dc.contributor.imecauthor | Wu, Zhicheng | |
| dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
| dc.contributor.imecauthor | Franco, Jacopo | |
| dc.contributor.imecauthor | Subhechha, Subhali | |
| dc.contributor.imecauthor | Dekkers, Harold | |
| dc.contributor.imecauthor | Yengula Venkata Ramana, Bhuvaneshwari | |
| dc.contributor.imecauthor | Belmonte, Attilio | |
| dc.contributor.imecauthor | Rassoul, Nouredine | |
| dc.contributor.imecauthor | van Setten, Michiel | |
| dc.contributor.imecauthor | Delhougne, Romain | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Kar, Gouri Sankar | |
| dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
| dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
| dc.contributor.orcidimec | Subhechha, Subhali::0000-0002-1960-5136 | |
| dc.contributor.orcidimec | Dekkers, Harold::0000-0003-4778-5709 | |
| dc.contributor.orcidimec | Rassoul, Nouredine::0000-0001-9489-3396 | |
| dc.contributor.orcidimec | van Setten, Michiel::0000-0003-0557-5260 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2023-06-01T12:28:42Z | |
| dc.date.available | 2023-05-25T20:20:02Z | |
| dc.date.available | 2023-06-01T12:28:42Z | |
| dc.date.issued | 2022 | |
| dc.identifier.doi | 10.1109/IEDM45625.2022.10019454 | |
| dc.identifier.eisbn | 978-1-6654-8959-1 | |
| dc.identifier.issn | 2380-9248 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41624 | |
| dc.publisher | IEEE | |
| dc.source.conference | International Electron Devices Meeting (IEDM) | |
| dc.source.conferencedate | DEC 03-07, 2022 | |
| dc.source.conferencelocation | San Francisco | |
| dc.source.journal | na | |
| dc.source.numberofpages | 4 | |
| dc.title | Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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