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Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy
dc.contributor.author | Wu, Z. | |
dc.contributor.author | Chasin, A. | |
dc.contributor.author | Franco, J. | |
dc.contributor.author | Subhechha, S. | |
dc.contributor.author | Dekkers, H. | |
dc.contributor.author | Bhuvaneshwari, Y. V. | |
dc.contributor.author | Belmonte, A. | |
dc.contributor.author | Rassoul, N. | |
dc.contributor.author | van Setten, M. J. | |
dc.contributor.author | Afanas'ev, V. | |
dc.contributor.author | Delhougne, R. | |
dc.contributor.author | Kaczer, B. | |
dc.contributor.author | Kar, G. S. | |
dc.date.accessioned | 2023-05-25T20:20:02Z | |
dc.date.available | 2023-05-25T20:20:02Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 2380-9248 | |
dc.identifier.other | WOS:000968800700110 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41624 | |
dc.source | WOS | |
dc.title | Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Wu, Z. | |
dc.contributor.imecauthor | Chasin, A. | |
dc.contributor.imecauthor | Franco, J. | |
dc.contributor.imecauthor | Subhechha, S. | |
dc.contributor.imecauthor | Dekkers, H. | |
dc.contributor.imecauthor | Bhuvaneshwari, Y. V. | |
dc.contributor.imecauthor | Belmonte, A. | |
dc.contributor.imecauthor | Rassoul, N. | |
dc.contributor.imecauthor | van Setten, M. J. | |
dc.contributor.imecauthor | Delhougne, R. | |
dc.contributor.imecauthor | Kaczer, B. | |
dc.contributor.imecauthor | Kar, G. S. | |
dc.identifier.doi | 10.1109/IEDM45625.2022.10019454 | |
dc.identifier.eisbn | 978-1-6654-8959-1 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | International Electron Devices Meeting (IEDM) | |
dc.source.conferencedate | DEC 03-07, 2022 | |
dc.source.conferencelocation | San Francisco | |
imec.availability | Under review |
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