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Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions

dc.contributor.authorYu, Hao
dc.contributor.authorParvais, B.
dc.contributor.authorPeralagu, U.
dc.contributor.authorElKashlan, R. Y.
dc.contributor.authorRodriguez, R.
dc.contributor.authorKhaled, A.
dc.contributor.authorYadav, S.
dc.contributor.authorAlian, A.
dc.contributor.authorZhao, M.
dc.contributor.authorBraga, N. de Almeida
dc.contributor.authorCobb, J.
dc.contributor.authorFang, J.
dc.contributor.authorCardinael, P.
dc.contributor.authorSibaja-Hernandez, A.
dc.contributor.authorCollaert, N.
dc.date.accessioned2023-05-31T07:53:59Z
dc.date.available2023-05-25T20:20:22Z
dc.date.available2023-05-31T07:53:59Z
dc.date.issued2022-12-01
dc.identifier.issn2380-9248
dc.identifier.otherWOS:000968800700145
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41628.2
dc.sourceWOS
dc.titleBack Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions
dc.typeProceedings paper
dc.contributor.imecauthorYu, Hao
dc.contributor.imecauthorParvais, B.
dc.contributor.imecauthorPeralagu, U.
dc.contributor.imecauthorElKashlan, R. Y.
dc.contributor.imecauthorRodriguez, R.
dc.contributor.imecauthorKhaled, A.
dc.contributor.imecauthorYadav, S.
dc.contributor.imecauthorAlian, A.
dc.contributor.imecauthorZhao, M.
dc.contributor.imecauthorCardinael, P.
dc.contributor.imecauthorSibaja-Hernandez, A.
dc.contributor.imecauthorCollaert, N.
dc.contributor.orcidimecYu, Hao::0000-0002-1976-0259
dc.identifier.doi10.1109/IEDM45625.2022.10019489
dc.identifier.eisbn978-1-6654-8959-1
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.conferenceInternational Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 03-07, 2022
dc.source.conferencelocationSan Francisco
dc.source.journalInternational Electron Devices Meeting (IEDM)
imec.availabilityUnder review


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    VersionItemDateSummary
    320.500.12860/41628.32023-06-16T07:09:32Zvalidation by library/open access desk
    220.500.12860/41628.2*2023-05-31T07:45:41Zvalidation by imec author
    120.500.12860/416282023-05-25T20:20:22Z

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