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Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions
dc.contributor.author | Yu, Hao | |
dc.contributor.author | Parvais, B. | |
dc.contributor.author | Peralagu, U. | |
dc.contributor.author | ElKashlan, R. Y. | |
dc.contributor.author | Rodriguez, R. | |
dc.contributor.author | Khaled, A. | |
dc.contributor.author | Yadav, S. | |
dc.contributor.author | Alian, A. | |
dc.contributor.author | Zhao, M. | |
dc.contributor.author | Braga, N. de Almeida | |
dc.contributor.author | Cobb, J. | |
dc.contributor.author | Fang, J. | |
dc.contributor.author | Cardinael, P. | |
dc.contributor.author | Sibaja-Hernandez, A. | |
dc.contributor.author | Collaert, N. | |
dc.date.accessioned | 2023-05-31T07:53:59Z | |
dc.date.available | 2023-05-25T20:20:22Z | |
dc.date.available | 2023-05-31T07:53:59Z | |
dc.date.issued | 2022-12-01 | |
dc.identifier.issn | 2380-9248 | |
dc.identifier.other | WOS:000968800700145 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41628.2 | |
dc.source | WOS | |
dc.title | Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Yu, Hao | |
dc.contributor.imecauthor | Parvais, B. | |
dc.contributor.imecauthor | Peralagu, U. | |
dc.contributor.imecauthor | ElKashlan, R. Y. | |
dc.contributor.imecauthor | Rodriguez, R. | |
dc.contributor.imecauthor | Khaled, A. | |
dc.contributor.imecauthor | Yadav, S. | |
dc.contributor.imecauthor | Alian, A. | |
dc.contributor.imecauthor | Zhao, M. | |
dc.contributor.imecauthor | Cardinael, P. | |
dc.contributor.imecauthor | Sibaja-Hernandez, A. | |
dc.contributor.imecauthor | Collaert, N. | |
dc.contributor.orcidimec | Yu, Hao::0000-0002-1976-0259 | |
dc.identifier.doi | 10.1109/IEDM45625.2022.10019489 | |
dc.identifier.eisbn | 978-1-6654-8959-1 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | International Electron Devices Meeting (IEDM) | |
dc.source.conferencedate | DEC 03-07, 2022 | |
dc.source.conferencelocation | San Francisco | |
dc.source.journal | International Electron Devices Meeting (IEDM) | |
imec.availability | Under review |