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Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions
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Authors
Yu, Hao
;
Parvais, Bertrand
;
Peralagu, Uthayasankaran
;
ElKashlan, Rana Y.
;
Rodriguez, Raul
;
Khaled, Ahmad
;
Yadav, Sachin
;
Alian, AliReza
;
Zhao, Ming
;
Braga, N. de Almeida
;
Cobb, J.
;
Fang, J.
;
Cardinael, Pieter
;
Sibaja-Hernandez, Arturo
;
Collaert, Nadine
DOI
10.1109/IEDM45625.2022.10019489
EISBN
978-1-6654-8959-1
ISSN
2380-9248
Conference
International Electron Devices Meeting (IEDM)
Journal
na
Title
Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions
Publication type
Proceedings paper
Embargo date
2022-12-31
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Date
Summary
3
20.500.12860/41628.3
*
2023-06-16T07:09:32Z
validation by library/open access desk
2
20.500.12860/41628.2
2023-05-31T07:45:41Z
validation by imec author
1
20.500.12860/41628
2023-05-25T20:20:22Z
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