Show simple item record

Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions

dc.contributor.authorYu, Hao
dc.contributor.authorParvais, Bertrand
dc.contributor.authorPeralagu, Uthayasankaran
dc.contributor.authorElKashlan, Rana Y.
dc.contributor.authorRodriguez, Raul
dc.contributor.authorKhaled, Ahmad
dc.contributor.authorYadav, Sachin
dc.contributor.authorAlian, AliReza
dc.contributor.authorZhao, Ming
dc.contributor.authorBraga, N. de Almeida
dc.contributor.authorCobb, J.
dc.contributor.authorFang, J.
dc.contributor.authorCardinael, Pieter
dc.contributor.authorSibaja-Hernandez, Arturo
dc.contributor.authorCollaert, Nadine
dc.date.accessioned2023-06-16T07:16:40Z
dc.date.available2023-05-25T20:20:22Z
dc.date.available2023-05-31T07:53:59Z
dc.date.available2023-06-16T07:16:40Z
dc.date.issued2022-12-01
dc.identifier.issn2380-9248
dc.identifier.otherWOS:000968800700145
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41628.3
dc.sourceWOS
dc.titleBack Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions
dc.typeProceedings paper
dc.contributor.imecauthorYu, Hao
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorPeralagu, Uthayasankaran
dc.contributor.imecauthorElKashlan, Rana Y.
dc.contributor.imecauthorRodriguez, Raul
dc.contributor.imecauthorKhaled, Ahmad
dc.contributor.imecauthorYadav, Sachin
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorCardinael, Pieter
dc.contributor.imecauthorSibaja-Hernandez, Arturo
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecYu, Hao::0000-0002-1976-0259
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecPeralagu, Uthayasankaran::0000-0001-9166-4408
dc.contributor.orcidimecElKashlan, Rana Y.::0000-0003-0576-4344
dc.contributor.orcidimecRodriguez, Raul::0000-0002-4457-8942
dc.contributor.orcidimecKhaled, Ahmad::0000-0003-2892-3176
dc.contributor.orcidimecYadav, Sachin::0000-0003-4530-2603
dc.contributor.orcidimecAlian, AliReza::0000-0003-3463-416X
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.contributor.orcidimecCardinael, Pieter::0000-0002-8603-2497
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo2022-12-31
dc.identifier.doi10.1109/IEDM45625.2022.10019489
dc.identifier.eisbn978-1-6654-8959-1
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.conferenceInternational Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 03-07, 2022
dc.source.conferencelocationSan Francisco
dc.source.journalna
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
2022_BackBarrier_IEDM_vFinal.pdf
Size:
801.7Kb
Format:
PDF
Description:
Accepted version
View/open

This item appears in the following collection(s)

Show simple item record

Version history

VersionItemDateSummary
320.500.12860/41628.3*2023-06-16T07:09:32Zvalidation by library/open access desk
220.500.12860/41628.22023-05-31T07:45:41Zvalidation by imec author
120.500.12860/416282023-05-25T20:20:22Z

*Selected version