dc.contributor.author | Yu, Hao | |
dc.contributor.author | Parvais, Bertrand | |
dc.contributor.author | Peralagu, Uthayasankaran | |
dc.contributor.author | ElKashlan, Rana Y. | |
dc.contributor.author | Rodriguez, Raul | |
dc.contributor.author | Khaled, Ahmad | |
dc.contributor.author | Yadav, Sachin | |
dc.contributor.author | Alian, AliReza | |
dc.contributor.author | Zhao, Ming | |
dc.contributor.author | Braga, N. de Almeida | |
dc.contributor.author | Cobb, J. | |
dc.contributor.author | Fang, J. | |
dc.contributor.author | Cardinael, Pieter | |
dc.contributor.author | Sibaja-Hernandez, Arturo | |
dc.contributor.author | Collaert, Nadine | |
dc.date.accessioned | 2023-06-16T07:16:40Z | |
dc.date.available | 2023-05-25T20:20:22Z | |
dc.date.available | 2023-05-31T07:53:59Z | |
dc.date.available | 2023-06-16T07:16:40Z | |
dc.date.issued | 2022-12-01 | |
dc.identifier.issn | 2380-9248 | |
dc.identifier.other | WOS:000968800700145 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41628.3 | |
dc.source | WOS | |
dc.title | Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Yu, Hao | |
dc.contributor.imecauthor | Parvais, Bertrand | |
dc.contributor.imecauthor | Peralagu, Uthayasankaran | |
dc.contributor.imecauthor | ElKashlan, Rana Y. | |
dc.contributor.imecauthor | Rodriguez, Raul | |
dc.contributor.imecauthor | Khaled, Ahmad | |
dc.contributor.imecauthor | Yadav, Sachin | |
dc.contributor.imecauthor | Alian, AliReza | |
dc.contributor.imecauthor | Zhao, Ming | |
dc.contributor.imecauthor | Cardinael, Pieter | |
dc.contributor.imecauthor | Sibaja-Hernandez, Arturo | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.orcidimec | Yu, Hao::0000-0002-1976-0259 | |
dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
dc.contributor.orcidimec | Peralagu, Uthayasankaran::0000-0001-9166-4408 | |
dc.contributor.orcidimec | ElKashlan, Rana Y.::0000-0003-0576-4344 | |
dc.contributor.orcidimec | Rodriguez, Raul::0000-0002-4457-8942 | |
dc.contributor.orcidimec | Khaled, Ahmad::0000-0003-2892-3176 | |
dc.contributor.orcidimec | Yadav, Sachin::0000-0003-4530-2603 | |
dc.contributor.orcidimec | Alian, AliReza::0000-0003-3463-416X | |
dc.contributor.orcidimec | Zhao, Ming::0000-0002-0856-851X | |
dc.contributor.orcidimec | Cardinael, Pieter::0000-0002-8603-2497 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.date.embargo | 2022-12-31 | |
dc.identifier.doi | 10.1109/IEDM45625.2022.10019489 | |
dc.identifier.eisbn | 978-1-6654-8959-1 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | International Electron Devices Meeting (IEDM) | |
dc.source.conferencedate | DEC 03-07, 2022 | |
dc.source.conferencelocation | San Francisco | |
dc.source.journal | na | |
imec.availability | Published - open access | |