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Comprehensive Investigations of HBM ESD Robustness for GaN-on-Si RF HEMTs
dc.contributor.author | Sandupatla, Abhinay | |
dc.contributor.author | Wu, Wei-Min | |
dc.contributor.author | Shih, Chun-An | |
dc.contributor.author | Chen, Shih-Hung | |
dc.contributor.author | Sibaja-Hernandez, Arturo | |
dc.contributor.author | Parvais, Bertrand | |
dc.contributor.author | Peralagu, Uthayasankaran | |
dc.contributor.author | Alian, AliReza | |
dc.contributor.author | Wu, T. -L. | |
dc.contributor.author | Ker, M. -D. | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Collaert, Nadine | |
dc.date.accessioned | 2023-05-25T20:20:25Z | |
dc.date.available | 2023-05-25T20:20:25Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 2380-9248 | |
dc.identifier.other | WOS:000968800700016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41635 | |
dc.source | WOS | |
dc.title | Comprehensive Investigations of HBM ESD Robustness for GaN-on-Si RF HEMTs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Sandupatla, Abhinay | |
dc.contributor.imecauthor | Wu, Wei-Min | |
dc.contributor.imecauthor | Shih, Chun-An | |
dc.contributor.imecauthor | Chen, Shih-Hung | |
dc.contributor.imecauthor | Sibaja-Hernandez, Arturo | |
dc.contributor.imecauthor | Parvais, Bertrand | |
dc.contributor.imecauthor | Peralagu, Uthayasankaran | |
dc.contributor.imecauthor | Alian, AliReza | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.orcidimec | Chen, Shih-Hung::0000-0002-6481-2951 | |
dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
dc.contributor.orcidimec | Peralagu, Uthayasankaran::0000-0001-9166-4408 | |
dc.contributor.orcidimec | Alian, AliReza::0000-0003-3463-416X | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.identifier.doi | 10.1109/IEDM45625.2022.10019357 | |
dc.identifier.eisbn | 978-1-6654-8959-1 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | International Electron Devices Meeting (IEDM) | |
dc.source.conferencedate | DEC 03-07, 2022 | |
dc.source.conferencelocation | San Francisco | |
imec.availability | Under review |
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