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Comprehensive Investigations of HBM ESD Robustness for GaN-on-Si RF HEMTs
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Authors
Sandupatla, Abhinay
;
Wu, Wei-Min
;
Shih, Chun-An
;
Chen, Shih-Hung
;
Sibaja-Hernandez, Arturo
;
Parvais, Bertrand
;
Peralagu, Uthayasankaran
;
Alian, AliReza
;
Wu, T. -L.
;
Ker, M. -D.
;
Groeseneken, Guido
;
Collaert, Nadine
DOI
10.1109/IEDM45625.2022.10019357
EISBN
978-1-6654-8959-1
ISSN
2380-9248
Conference
International Electron Devices Meeting (IEDM)
Journal
na
Title
Comprehensive Investigations of HBM ESD Robustness for GaN-on-Si RF HEMTs
Publication type
Proceedings paper
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Date
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2
20.500.12860/41635.2
*
2023-06-16T08:41:50Z
validation by library/open access desk
1
20.500.12860/41635
2023-05-25T20:20:25Z
*Selected version
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