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A comprehensive variability study of doped HfO2 FeFET for memory applications

dc.contributor.authorRonchi, Nicolo
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorCelano, Umberto
dc.contributor.authorKaczer, Ben
dc.contributor.authorKaczmarek, Jakub
dc.contributor.authorBanerjee, Kaustuv
dc.contributor.authorMcMitchell, Sean
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2023-06-15T14:06:47Z
dc.date.available2023-06-15T14:06:47Z
dc.date.issued2022
dc.identifier.issn2330-7978
dc.identifier.otherWOS:000869001800022
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41736
dc.sourceWOS
dc.titleA comprehensive variability study of doped HfO2 FeFET for memory applications
dc.typeProceedings paper
dc.contributor.imecauthorRonchi, Nicolo
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorKaczmarek, Jakub
dc.contributor.imecauthorBanerjee, Kaustuv
dc.contributor.imecauthorMcMitchell, Sean
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecKaczer, B.::0000-0002-1484-4007
dc.contributor.orcidimecMcMitchell, S. R. C.::0000-0002-9916-0973
dc.contributor.orcidimecRonchi, Nicolo::0000-0002-7961-4077
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecBanerjee, Kaustuv::0000-0001-8003-6211
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.identifier.doi10.1109/IMW52921.2022.9779294
dc.identifier.eisbn978-1-6654-9947-7
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.beginpage85
dc.source.endpage88
dc.source.conference14th IEEE International Memory Workshop (IMW)
dc.source.conferencedateMAR 15-18, 2022
dc.source.conferencelocationDresden
dc.source.journalna
imec.availabilityPublished - imec


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