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Outlier analysis for understanding process variations and probable defects
Publication:
Outlier analysis for understanding process variations and probable defects
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Date
2022
Proceedings Paper
https://doi.org/10.1117/12.2616679
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gupta, Mihir
;
Rincon Delgadillo, Paulina
;
Suh, Hyo Seon
;
Halder, Sandip
;
Dusa, Mircea
Journal
Proceedings of SPIE
Abstract
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262
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Acq. date: 2026-01-09
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1137
since deposited on 2023-06-20
Acq. date: 2026-01-09
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Metrics
Downloads
262
since deposited on 2023-06-20
28
last month
4
last week
Acq. date: 2026-01-09
Views
1137
since deposited on 2023-06-20
Acq. date: 2026-01-09
Citations