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Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
dc.contributor.author | Waldhoer, Dominic | |
dc.contributor.author | Schleich, Christian | |
dc.contributor.author | Michl, Jakob | |
dc.contributor.author | Grill, Alexander | |
dc.contributor.author | Claes, Dieter | |
dc.contributor.author | Karl, Alexander | |
dc.contributor.author | Knobloch, Theresia | |
dc.contributor.author | Rzepa, Gerhard | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Waltl, Michael | |
dc.contributor.author | Grasser, Tibor | |
dc.date.accessioned | 2023-06-23T20:39:03Z | |
dc.date.available | 2023-06-23T20:39:03Z | |
dc.date.issued | 2023-JUL | |
dc.identifier.issn | 0026-2714 | |
dc.identifier.other | WOS:001001940400001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42076 | |
dc.source | WOS | |
dc.title | Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices | |
dc.type | Journal article | |
dc.contributor.imecauthor | Grill, Alexander | |
dc.contributor.imecauthor | Claes, Dieter | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.identifier.doi | 10.1016/j.microrel.2023.115004 | |
dc.source.numberofpages | 15 | |
dc.source.peerreview | yes | |
dc.source.journal | MICROELECTRONICS RELIABILITY | |
dc.source.volume | 146 | |
imec.availability | Under review |
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