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Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations
dc.contributor.author | Vandemaele, Michiel | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Bury, Erik | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Chasin, Adrian | |
dc.contributor.author | Makarov, Alexander | |
dc.contributor.author | Mertens, Hans | |
dc.contributor.author | Hellings, Geert | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2023-07-31T10:13:51Z | |
dc.date.available | 2023-07-15T17:05:29Z | |
dc.date.available | 2023-07-31T10:13:51Z | |
dc.date.issued | 2023-05-15 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:001007431500148 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42148.2 | |
dc.source | WOS | |
dc.title | Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vandemaele, Michiel | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Bury, Erik | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Chasin, Adrian | |
dc.contributor.imecauthor | Makarov, Alexander | |
dc.contributor.imecauthor | Mertens, Hans | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Vandemaele, Michiel::0000-0003-0740-4115 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Makarov, Alexander::0000-0002-9927-6511 | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.identifier.doi | 10.1109/IRPS48203.2023.10118211 | |
dc.identifier.eisbn | 978-1-6654-5672-2 | |
dc.source.numberofpages | 10 | |
dc.source.peerreview | yes | |
dc.subject.discipline | Electrical & electronic engineering | |
dc.source.conference | 61st IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | MAR 26-30, 2023 | |
dc.source.conferencelocation | Monterey | |
dc.source.journal | NA | |
imec.availability | Under review |